Yaru Ding

Orcid: 0000-0002-0163-7869

According to our database1, Yaru Ding authored at least 13 papers between 2020 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2024
Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
Development and Optimization of a Two-Degree-of-Freedom Piezoelectric Harvester Based on Parallel Cantilever Structure With Magnetic Coupling.
IEEE Access, 2023

GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Interval time dependent wake-up effect of HfZrO ferroelectric capacitor.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Design and Implementation of SFC Monitoring and Alerting Based on YANG Data Model.
Proceedings of the IEEE Intl Conf on Parallel & Distributed Processing with Applications, 2022

The Design and Specification of Path Adjustable SFC Using YANG Data Model.
Proceedings of the IEEE Symposium on Computers and Communications, 2022

Universal Hot Carrier Degradation Model under DC and AC Stresses.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
Design and Implementation of Wearable Dynamic Electrocardiograph Real-Time Monitoring Terminal.
IEEE Access, 2020


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