Riho Aoki

According to our database, Riho Aoki authored at least 5 papers between 2019 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Study on Crest Factor Controlled Multi-Tone Signal for Analog RF Circuit Testing.

Yukiko Shibasaki, Koji Asami, Akemi Hatta, Riho Aoki, Anna Kuwana, Haruo Kobayashi

Proceedings of the International SoC Design Conference, 2020

Analysis and Design of Multi-Tone Signal Generation Algorithms for Reducing Crest Factor.

Yukiko Shibasaki, Koji Asami, Riho Aoki, Akemi Hatta, Anna Kuwana, Haruo Kobayashi

Proceedings of the 29th IEEE Asian Test Symposium, 2020

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers.

Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019

Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion.

Yuto Sasaki, Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the IEEE International Test Conference in Asia, 2019

Evaluation of Null Method for Operational Amplifier Short-Time Testing.

Riho Aoki, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Yuto Sasaki, Kosuke Machida, Takayuki Nakatani, Jianlong Wang, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the 13th IEEE International Conference on ASIC, 2019