Gaku Ogihara

According to our database, Gaku Ogihara authored at least 6 papers between 2020 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Innovative Practices Track: Innovative Analog Circuit Testing Technologies.

Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel J. Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST.

Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer.

Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Akemi Hatta, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Yujie Zhao, Minh Tri Tran, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the IEEE International Test Conference, 2021

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production.

Gaku Ogihara, Takayuki Nakatani, Daisuke Iimori, Shogo Katayama, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Jianglin Wei, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the 28th IEEE International Conference on Electronics, 2021

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment.

Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the 30th IEEE Asian Test Symposium, 2021

2020

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers.

Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the 29th IEEE Asian Test Symposium, 2020