Jeffrey Lam

According to our database1, Jeffrey Lam authored at least 10 papers between 2015 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
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Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2018
Solving 28 nm I/O circuit reliability issue due to IC design weakness.
Microelectron. Reliab., 2018

2017
Static fault localization of subtle metallization defects using near infrared photon emission microscopy.
Microelectron. Reliab., 2017

Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect.
Microelectron. Reliab., 2017

In-depth circuits edit analysis to reveal the implantation-related defect.
Microelectron. J., 2017

Concurrent built-in self-testing under the constraint of shared test resources and its test time reduction.
Integr., 2017

2016
Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.
Microelectron. Reliab., 2016

Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue.
Microelectron. Reliab., 2016

Cross-sectional nanoprobing fault isolation technique on submicron devices.
Microelectron. Reliab., 2016

Electrical analysis on implantation-related defect by nanoprobing methodology.
Microelectron. Reliab., 2016

2015
Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique.
Microelectron. Reliab., 2015


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