Francis Rivai

According to our database1, Francis Rivai authored at least 6 papers between 2016 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2018
Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique.
Microelectron. Reliab., 2018

2017
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.
Microelectron. Reliab., 2017

Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.
Microelectron. Reliab., 2017

2016
Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.
Microelectron. Reliab., 2016

Cross-sectional nanoprobing fault isolation technique on submicron devices.
Microelectron. Reliab., 2016

Electrical analysis on implantation-related defect by nanoprobing methodology.
Microelectron. Reliab., 2016


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