We stand with Ukraine

We stand with Ukraine

Yiwen Shi

Orcid: 0000-0003-4152-1470

According to our database¹, Yiwen Shi authored at least 20 papers between 2008 and 2023.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Timeline

Legend:

Book

In proceedings

Article

PhD thesis

Dataset

Other

Links

On csauthors.net:

Bibliography

2023

Leveraging GPT-4 for food effect summarization to enhance product-specific guidance development via iterative prompting.

[BibT_eX]

[DOI]

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Taha ValizadehAslani

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J. Biomed. Informatics, December, 2023

PharmBERT: a domain-specific BERT model for drug labels.

[BibT_eX]

[DOI]

Taha ValizadehAslani

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Briefings Bioinform., July, 2023

Fine-tuning BERT for automatic ADME semantic labeling in FDA drug labeling to enhance product-specific guidance assessment.

[BibT_eX]

[DOI]

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Taha ValizadehAslani

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J. Biomed. Informatics, February, 2023

Partisan US News Media Representations of Syrian Refugees.

[BibT_eX]

[DOI]

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Marzieh Babaeianjelodar

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Kamila Janmohamed

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Thomas Davidson

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Munmun De Choudhury

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Ashiqur R. KhudaBukhsh

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Orestis Papakyriakopoulos

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Kaveh Khoshnood

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Proceedings of the Seventeenth International AAAI Conference on Web and Social Media, 2023

2022

Two-Stage Fine-Tuning: A Novel Strategy for Learning Class-Imbalanced Data.

[BibT_eX]

[DOI]

Taha ValizadehAslani

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CoRR, 2022

Partisan US News Media Representations of Syrian Refugees.

[BibT_eX]

[DOI]

,

Marzieh Babaeianjelodar

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,

Kamila Janmohamed

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,

,

Thomas Davidson

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Munmun De Choudhury

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,

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Ashiqur R. KhudaBukhsh

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Preslav Ivanov Nakov

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Orestis Papakyriakopoulos

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Kaveh Khoshnood

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CoRR, 2022

Linguistic Approach to Segmenting Source Code.

[BibT_eX]

[DOI]

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Daniel Schwartz

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Spiros Mancoridis

Proceedings of the 16th IEEE International Conference on Semantic Computing, 2022

How Is Vaping Framed on Online Knowledge Dissemination Platforms?

[BibT_eX]

[DOI]

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Munmun De Choudhury

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Ashiqur R. KhudaBukhsh

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Marzieh Babaeianjelodar

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Frederick L. Altice

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Proceedings of the Social, Cultural, and Behavioral Modeling, 2022

Improving Imbalanced Learning by Pre-finetuning with Data Augmentation.

[BibT_eX]

[DOI]

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Taha ValizadehAslani

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Proceedings of the Fourth International Workshop on Learning with Imbalanced Domains: Theory and Applications, 2022

US News and Social Media Framing Around Vaping.

[BibT_eX]

[DOI]

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Marzieh Babaeianjelodar

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Preslav Ivanov Nakov

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Ashiqur R. KhudaBukhsh

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Munmun De Choudhury

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Frederick L. Altice

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Proceedings of the Computational Data and Social Networks - 11th International Conference, 2022

2021

Information Extraction From FDA Drug Labeling to Enhance Product-Specific Guidance Assessment Using Natural Language Processing.

[BibT_eX]

[DOI]

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Frontiers Res. Metrics Anal., 2021

Relational Attention with Textual Enhanced Transformer for Image Captioning.

[BibT_eX]

[DOI]

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Proceedings of the Pattern Recognition and Computer Vision - 4th Chinese Conference, 2021

Dual Stream Fusion Network for Multi-spectral High Resolution Remote Sensing Image Segmentation.

[BibT_eX]

[DOI]

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Proceedings of the Pattern Recognition and Computer Vision - 4th Chinese Conference, 2021

2013

A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects.

[BibT_eX]

[DOI]

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Jennifer Dworak

J. Electron. Test., 2013

2012

Using implications to choose tests through suspect fault identification.

[BibT_eX]

[DOI]

Jennifer Dworak

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Nicholas Imbriglia

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ACM Trans. Design Autom. Electr. Syst., 2012

2011

Enhancing online error detection through area-efficient multi-site implications.

[BibT_eX]

[DOI]

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Jennifer Dworak

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Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Partial state monitoring for fault detection estimation.

[BibT_eX]

[DOI]

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Kantapon Kaewtip

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Jennifer Dworak

Proceedings of the 2011 IEEE International Test Conference, 2011

Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis.

[BibT_eX]

[DOI]

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Nicholas Imbriglia

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Jennifer Dworak

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Proceedings of the 16th European Test Symposium, 2011

2010

Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects.

[BibT_eX]

[DOI]

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Jennifer Dworak

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

2008

Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization.

[BibT_eX]

[DOI]

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Jennifer Dworak

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

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