Sen Mei

According to our database, Sen Mei authored at least 10 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

A 3D prediction model for benign or malignant of pulmonary nodules based on neural architecture search.

Lei Yang, Sen Mei, Pan Liang, Yan Li, Ling Ma, Jianbo Gao, Huiqin Jiang

Signal Image Video Process., February, 2024

2023

Unlock Multi-Modal Capability of Dense Retrieval via Visual Module Plugin.

Tianshuo Zhou, Sen Mei, Xinze Li, Zhenghao Liu, Chenyan Xiong, Zhiyuan Liu, Yu Gu, Ge Yu

CoRR, 2023

Text Matching Improves Sequential Recommendation by Reducing Popularity Biases.

Zhenghao Liu, Sen Mei, Chenyan Xiong, Xiaohua Li, Shi Yu, Zhiyuan Liu, Yu Gu, Ge Yu

Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, 2023

2020

Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device.

Laiqiang Luo, Kalya Shubhakar, Sen Mei, Nagarajan Raghavan, Fan Zhang, Danny Shum, Kin Leong Pey

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress.

Xuan Feng, Nagarajan Raghavan, Sen Mei, Shurong Dong, Kin Leong Pey, Hei Wong

Microelectron. Reliab., 2018

Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics.

Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction.

Jia Hao Lim, Nagarajan Raghavan, Sen Mei, Vinayak Bharat Naik, Jae Hyun Kwon, S. M. Noh, B. Liu, E. H. Toh, Nyuk Leong Chung, Robin Chao, K. H. Lee, Kin Leong Pey

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016

Conductive filament formation at grain boundary locations in polycrystalline HfO₂ -based MIM stacks: Computational and physical insight.

Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey

Microelectron. Reliab., 2016

Compliance current dominates evolution of NiSi₂ defect size in Ni/dielectric/Si RRAM devices.

Sen Mei, Michel Bosman, Nagarajan Raghavan, Xing Wu, Kin Leong Pey

Microelectron. Reliab., 2016

2015

Real-Time Data Acquisition and Model Identification for Powered Parafoil UAV.

Bingbing Li, Juntong Qi, Tianyu Lin, Sen Mei, Dalei Song, Jianda Han

Proceedings of the Intelligent Robotics and Applications - 8th International Conference, 2015