Sanmitra Banerjee

According to our database, Sanmitra Banerjee authored at least 33 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

DOCTOR: Dynamic On-Chip Remediation Against Temporally-Drifting Thermal Variations Toward Self-Corrected Photonic Tensor Accelerators.

Haotian Lu, Sanmitra Banerjee, Jiaqi Gu

CoRR, 2024

2023

Transferable Graph Neural Network-Based Delay-Fault Localization for Monolithic 3-D ICs.

Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023

On the Impact of Uncertainties in Silicon-Photonic Neural Networks.

Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty

IEEE Des. Test, April, 2023

Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs.

Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., March, 2023

ChipNeMo: Domain-Adapted LLMs for Chip Design.

Mingjie Liu, Teodor-Dumitru Ene, Robert Kirby, Chris Cheng, Nathaniel Ross Pinckney, Rongjian Liang, Jonah Alben, Himyanshu Anand, Sanmitra Banerjee, Ismet Bayraktaroglu, Bonita Bhaskaran, Bryan Catanzaro, Arjun Chaudhuri, Sharon Clay, Bill Dally, Laura Dang, Parikshit Deshpande, Siddhanth Dhodhi, Sameer Halepete, Eric Hill, Jiashang Hu, Sumit Jain, Brucek Khailany, Kishor Kunal, Xiaowei Li, Hao Liu, Stuart F. Oberman, Sujeet Omar, Sreedhar Pratty, Jonathan Raiman, Ambar Sarkar, Zhengjiang Shao, Hanfei Sun, Pratik P. Suthar, Varun Tej, Kaizhe Xu, Haoxing Ren

CoRR, 2023

Compact and Low-Loss PCM-based Silicon Photonic MZIs for Photonic Neural Networks.

Amin Shafiee, Sanmitra Banerjee, Benoît Charbonnier, Sudeep Pasricha, Mahdi Nikdast

CoRR, 2023

Analysis of Optical Loss and Crosstalk Noise in MZI-based Coherent Photonic Neural Networks.

Amin Shafiee, Sanmitra Banerjee, Krishnendu Chakrabarty, Sudeep Pasricha, Mahdi Nikdast

CoRR, 2023

Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs ^*.

Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs.

Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2023

2022

Design Automation and Test Solutions for Monolithic 3D ICs.

Lingjun Zhu, Arjun Chaudhuri, Sanmitra Banerjee, Gauthaman Murali, Pruek Vanna-Iampikul, Krishnendu Chakrabarty, Sung Kyu Lim

ACM J. Emerg. Technol. Comput. Syst., 2022

Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs.

Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Heechun Park, Bon Woong Ku, Sukeshwar Kannan, Krishnendu Chakrabarty, Sung Kyu Lim

ACM J. Emerg. Technol. Comput. Syst., 2022

Characterizing Coherent Integrated Photonic Neural Networks under Imperfections.

Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty

CoRR, 2022

Characterization and Optimization of Integrated Silicon-Photonic Neural Networks under Fabrication-Process Variations.

Asif Mirza, Amin Shafiee, Sanmitra Banerjee, Krishnendu Chakrabarty, Sudeep Pasricha, Mahdi Nikdast

CoRR, 2022

CHAMP: Coherent Hardware-Aware Magnitude Pruning of Integrated Photonic Neural Networks.

Sanmitra Banerjee, Mahdi Nikdast, Sudeep Pasricha, Krishnendu Chakrabarty

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2022

Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration.

Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2022

Pruning Coherent Integrated Photonic Neural Networks Using the Lottery Ticket Hypothesis.

Sanmitra Banerjee, Mahdi Nikdast, Sudeep Pasricha, Krishnendu Chakrabarty

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2022

Structural Test Generation for AI Accelerators using Neural Twins.

Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Observation Point Insertion Using Deep Learning.

Bonita Bhaskaran, Sanmitra Banerjee, Kaushik Narayanun, Shao-Chun Hung, Seyed Nima Mozaffari Mojaveri, Mengyun Liu, Gang Chen, Tung-Che Liang

Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022

LoCI: An Analysis of the Impact of Optical Loss and Crosstalk Noise in Integrated Silicon-Photonic Neural Networks.

Amin Shafiee, Sanmitra Banerjee, Krishnendu Chakrabarty, Sudeep Pasricha, Mahdi Nikdast

Proceedings of the GLSVLSI '22: Great Lakes Symposium on VLSI 2022, Irvine CA USA, June 6, 2022

Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs.

Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits.

Sanmitra Banerjee, Arjun Chaudhuri, August Ning, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., 2021

Optimizing Coherent Integrated Photonic Neural Networks under Random Uncertainties.

Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2021

ParaMitE: Mitigating Parasitic CNFETs in the Presence of Unetched CNTs.

Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Gauthaman Murali, Mark Nelson, Sung Kyu Lim, Krishnendu Chakrabarty

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

Modeling Silicon-Photonic Neural Networks under Uncertainties.

Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits.

Sanmitra Banerjee, Arjun Chaudhuri, Shao-Chun Hung, Krishnendu Chakrabarty

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs.

Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., 2020

Advances in Design and Test of Monolithic 3-D ICs.

Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Jinwoo Kim, Gauthaman Murali, Edward Lee, Daehyun Kim, Sung Kyu Lim, Saibal Mukhopadhyay, Krishnendu Chakrabarty

IEEE Des. Test, 2020

RTL-to-GDS Design Tools for Monolithic 3D ICs.

Jinwoo Kim, Gauthaman Murali, Pruek Vanna-Iampikul, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Saibal Mukhopadhyay, Sung Kyu Lim

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020

NodeRank: Observation-Point Insertion for Fault Localization in Monolithic 3D ICs^∗.

Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019

Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs.

Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Bon Woong Ku, Krishnendu Chakrabarty, Sung Kyu Lim

Proceedings of the 24th IEEE European Test Symposium, 2019

RTL-to-GDS Tool Flow and Design-for-Test Solutions for Monolithic 3D ICs.

Heechun Park, Kyungwook Chang, Bon Woong Ku, Jinwoo Kim, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Saibal Mukhopadhyay, Krishnendu Chakrabarty, Sung Kyu Lim

Proceedings of the 56th Annual Design Automation Conference 2019, 2019

2018

Detection of Third Heart Sound Using Variational Mode Decomposition.

Madhusudhan Mishra, Sanmitra Banerjee, Dennis C. Thomas, Sagnik Dutta, Anirban Mukherjee

IEEE Trans. Instrum. Meas., 2018

Grading heart sounds through variational mode decomposition and higher order spectral features.

Madhusudhan Mishra, Sawon Pratiher, Sanmitra Banerjee, Anirban Mukherjee

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018