Rajarajan Senguttuvan

According to our database, Rajarajan Senguttuvan authored at least 17 papers between 2005 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2011

Environment-Adaptive Concurrent Companding and Bias Control for Efficient Power-Amplifier Operation.

Shreyas Sen, Rajarajan Senguttuvan, Abhijit Chatterjee

IEEE Trans. Circuits Syst. I Regul. Pap., 2011

2009

Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers.

Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee

IEEE Trans. Very Large Scale Integr. Syst., 2009

Iterative built-in testing and tuning of mixed-signal/RF systems.

Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan

Proceedings of the 27th International Conference on Computer Design, 2009

2008

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems.

Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee

VLSI Design, 2008

Multidimensional Adaptive Power Management for Low-Power Operation of Wireless Devices.

Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee

IEEE Trans. Circuits Syst. II Express Briefs, 2008

Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise.

Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends.

Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Concurrent Multi-Dimensional Adaptation for Low-Power Operation in Wireless Devices.

Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee

Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

Adaptive Signal Scaling Driven Critical Path Modulation for Low Power Baseband OFDM Processors.

Muhammad Mudassar Nisar, Rajarajan Senguttuvan, Abhijit Chatterjee

Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms.

Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee

Proceedings of the 2008 IEEE International Test Conference, 2008

Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters.

Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee

Proceedings of the 13th European Test Symposium, 2008

Pro-VIZOR: process tunable virtually zero margin low power adaptive RF for wireless systems.

Shreyas Sen, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee

Proceedings of the 45th Design Automation Conference, 2008

Efficient Low-Cost Testing of Wireless OFDM Polar Transceiver Systems.

Deuk Lee, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection.

Rajarajan Senguttuvan, Abhijit Chatterjee

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Feedback Driven Adaptive Power Management for Minimum Power Operation of Wireless Receivers.

Shreyas Sen, Rajarajan Senguttuvan, Abhijit Chatterjee

Proceedings of the 14th IEEE International Conference on Electronics, 2007

VIZOR: Virtually zero margin adaptive RF for ultra low power wireless communication.

Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee

Proceedings of the 25th International Conference on Computer Design, 2007

2005

Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF.

Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005