Paul R. Chalker

According to our database, Paul R. Chalker authored at least 7 papers between 2007 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

The Impact of Etch Depth of D-mode AlGaN/GaN MIS-HEMTs on DC and AC Characteristics of 10 V Input Direct-Coupled FET Logic (DCFL) Inverters.

Miao Cui, Yutao Cai, Qinglei Bu, Wen Liu, Huiqing Wen, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker, Cezhou Zhao

Proceedings of the International Conference on IC Design and Technology, 2019

Effect of High-k Passivation Layer on Electrical Properties of GaN Metal-Insulator-Semiconductor Devices.

Yutao Cai, Yang Wang, Miao Cui, Wen Liu, Huiqing Wen, Cezhou Zhao, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker

Proceedings of the International Conference on IC Design and Technology, 2019

2015

Physical and electrical characterization of Mg-doped ZnO thin-film transistors.

A. Shaw, T. J. Whittles, Ivona Z. Mitrovic, J. D. Jin, J. S. Wrench, D. Hesp, V. R. Dhanak, Paul R. Chalker, Steve Hall

Proceedings of the 45th European Solid State Device Research Conference, 2015

2007

Charge trapping characterization of MOCVD HfO₂/p-Si interfaces at cryogenic temperatures.

I. P. Tyagulskyy, I. N. Osiyuk, V. S. Lysenko, A. N. Nazarov, Steve Hall, Octavian Buiu, Y. Lu, Richard Potter, Paul R. Chalker

Microelectron. Reliab., 2007

Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition.

P. Taechakumput, S. Taylor, Octavian Buiu, R. J. Potter, Paul R. Chalker, A. C. Jones

Microelectron. Reliab., 2007

Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition.

Y. Lu, Octavian Buiu, Steve Hall, Ivona Z. Mitrovic, W. Davey, R. J. Potter, Paul R. Chalker

Microelectron. Reliab., 2007

Charge trapping and interface states in hydrogen annealed HfO₂-Si structures.

Y. V. Gomeniuk, A. N. Nazarov, Ya. N. Vovk, V. S. Lysenko, Yi Lu, Octavian Buiu, Steve Hall, R. J. Potter, Paul R. Chalker

Microelectron. Reliab., 2007