Paul H. Kvam

Orcid: 0000-0003-4872-6604

Affiliations:
  • Georgia Institute of Technology, Atlanta, GA, USA


According to our database1, Paul H. Kvam authored at least 11 papers between 1999 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2021
Mixed-Effects Nonhomogeneous Poisson Process Model for Multiple Repairable Systems.
IEEE Access, 2021

2018
A Probability Model for Strategic Bidding on "The Price Is Right".
Decis. Anal., 2018

2011
Multi-cause degradation path model: a case study on rubidium lamp degradation.
Qual. Reliab. Eng. Int., 2011

2008
Length Bias in the Measurements of Carbon Nanotubes.
Technometrics, 2008

2007
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
IEEE Trans. Reliab., 2007

Degradation models and implied lifetime distributions.
Reliab. Eng. Syst. Saf., 2007

2006
Reliability Modeling in Spatially Distributed Logistics Systems.
IEEE Trans. Reliab., 2006

2004
A Nonlinear Random-Coefficients Model for Degradation Testing.
Technometrics, 2004

2002
Common cause failure prediction using data mapping.
Reliab. Eng. Syst. Saf., 2002

1999
Discussion.
Technometrics, 1999

Combined analytical and empirical learning framework for branch and bound algorithms: the knapsack problem.
Artif. Intell. Eng., 1999


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