Pascal Nouet
Orcid: 0000-0003-2137-2623
According to our database1,
Pascal Nouet
authored at least 66 papers
between 1999 and 2022.
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Bibliography
2022
2021
Exploring flexible and 3D printing technologies for the design of high spatial resolution EM probes.
Proceedings of the 19th IEEE International New Circuits and Systems Conference, 2021
Proceedings of the 18th Workshop on Fault Detection and Tolerance in Cryptography, 2021
2020
Low-voltage Low-power current-mode square-root circuit based on Quasi-floating gate technique.
Proceedings of the 17th International Multi-Conference on Systems, Signals & Devices, 2020
Optimal Detector Position and Structure for a New 3-axis CMOS Thermal Microaccelerometer.
Proceedings of the 17th International Multi-Conference on Systems, Signals & Devices, 2020
2018
A Temperature-Hardened Sensor Interface with a 12-Bit Digital Output Using a Novel Pulse Width Modulation Technique.
Sensors, 2018
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018
Mechanical Solution for Out-of-Plane Sensitivity Enhancement of CMOS MEMS Convective Accelerometers.
Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
2017
New time-domain conditioning circuit for resistive sensor: Behavioral modelling for simulation and optimization.
Proceedings of the 24th International Conference Mixed Design of Integrated Circuits and Systems, 2017
GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTack.
Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017
A high temperature, 12-bit-time-domain sensor interface based on injection locked oscillator.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic Logic.
Proceedings of the IEEE International Conference on Rebooting Computing, 2017
Combo of innovative educational approaches to teach industrial test to undergraduate students.
Proceedings of the 2017 IEEE Global Engineering Education Conference, 2017
Highly linear voltage-to-time converter based on injection locked relaxation oscillators.
Proceedings of the 14th International Multi-Conference on Systems, 2017
2016
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016
Proceedings of the Interactive Collaborative Learning - Proceedings of the 19th ICL Conference, 2016
Per peers learning educational approach to teach industrial test to undergraduate students.
Proceedings of the 11th European Workshop on Microelectronics Education, 2016
Proceedings of the 2016 IEEE Global Engineering Education Conference, 2016
2015
Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015
2014
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers.
J. Electron. Test., 2014
FINMINA: A French national project to promote innovation in higher education in microelectronics and nanotechnologies.
Proceedings of the 2014 Information Technology Based Higher Education and Training, 2014
2013
Microelectron. J., 2013
2012
Proceedings of the 10th IEEE International NEWCAS Conference, 2012
Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategy.
Proceedings of the 13th Latin American Test Workshop, 2012
An efficient control variates method for yield estimation of analog circuits based on a local model.
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
Proceedings of the 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2012
2011
A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level.
J. Electron. Test., 2011
Test and calibration of MEMS convective accelerometers with a fully electrical setup.
Proceedings of the 12th Latin American Test Workshop, 2011
An electrical test method for MEMS convective accelerometers: Development and evaluation.
Proceedings of the Design, Automation and Test in Europe, 2011
2010
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration.
J. Electron. Test., 2010
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels.
Proceedings of the 11th Latin American Test Workshop, 2010
A low power interface circuit for resistive sensors with digital offset compensation.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
2009
Characterization of the transient behavior of gated/STI diodes and their associated BJT in the CDM time domain.
Microelectron. Reliab., 2009
Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering.
Int. J. Online Eng., 2009
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE.
Proceedings of the Eighteentgh Asian Test Symposium, 2009
2008
VLSI Design, 2008
Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS
CoRR, 2008
CoRR, 2008
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2008
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2008
A novel method for test and calibration of capacitive accelerometers with a fully electrical setup.
Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008
2007
Instantaneous de-embedding of the on-wafer equivalent-circuit parameters of acoustic resonator (FBAR) for integrated circuit applications.
Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, 2007
Proceedings of the 12th European Test Symposium, 2007
2006
Microelectron. Reliab., 2006
J. Electron. Test., 2006
2005
Microelectron. Reliab., 2005
J. Electron. Test., 2005
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005
Proceedings of the 10th European Test Symposium, 2005
2004
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004
Microelectron. Reliab., 2004
Proceedings of the 9th European Test Symposium, 2004
2003
IEEE Des. Test Comput., 2003
2002
Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining.
Microelectron. Reliab., 2002
Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology.
Proceedings of the 3rd Latin American Test Workshop, 2002
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems.
Proceedings of the 2002 Design, 2002
2001
J. Electron. Test., 2001
Impact of Technology Spreading on MEMS design Robustness.
Proceedings of the SOC Design Methodologies, 2001
Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing.
Proceedings of the SOC Design Methodologies, 2001
Interconnect Capacitance Modelling in a VDSM CMOS Technology.
Proceedings of the SOC Design Methodologies, 2001
1999
Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts.
Proceedings of the 1999 Design, 1999
Proceedings of the 1999 Design, 1999