Maria Stangoni
According to our database1,
Maria Stangoni
authored at least 9 papers
between 2002 and 2011.
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Bibliography
2011
Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications.
Microelectron. Reliab., 2011
2009
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation.
Microelectron. Reliab., 2009
2005
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices.
Microelectron. Reliab., 2005
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast.
Microelectron. Reliab., 2005
2004
On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques.
Microelectron. Reliab., 2004
2D Dopant Profiling on 4H Silicon Carbide P<sup>+</sup>N Junction by Scanning Capacitance and Scanning Electron Microscopy.
Microelectron. Reliab., 2004
2003
A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy.
Microelectron. Reliab., 2003
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.
Microelectron. Reliab., 2003
2002
Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction.
Microelectron. Reliab., 2002