Kazunari Enokimoto

According to our database, Kazunari Enokimoto authored at least 6 papers between 2009 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression.

Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang

Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013

2012

A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits.

Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2011

Power-aware test generation with guaranteed launch safety for at-speed scan testing.

Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures.

Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich

Proceedings of the 2011 International Symposium on Low Power Electronics and Design, 2011

Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling.

Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2009

CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.

Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa

Proceedings of the Eighteentgh Asian Test Symposium, 2009