Katsuya Kikuchi

Orcid: 0000-0001-7590-8409

Affiliations:
  • National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan


According to our database1, Katsuya Kikuchi authored at least 29 papers between 2006 and 2021.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2021
Analysis and evaluation of noise coupling between through-silicon-vias.
IEICE Electron. Express, 2021

Landside capacitor efficacy among multi-chip-module using Si-interposer.
IEICE Electron. Express, 2021

2020
Si-Backside Protection Circuits Against Physical Security Attacks on Flip-Chip Devices.
IEEE J. Solid State Circuits, 2020

2019
Over-the-top Si Interposer Embedding Backside Buried Metal PDN to Reduce Power Supply Impedance of Large Scale Digital ICs.
Proceedings of the 2019 International 3D Systems Integration Conference (3DIC), 2019

Thermal Stress Comparison of Annular-Trench-Isolated (ATI) TSV with Cu and Solder Core.
Proceedings of the 2019 International 3D Systems Integration Conference (3DIC), 2019

Electrostatic Shield TSVs to Suppress Coupling Among Stacked ICs.
Proceedings of the 2019 International 3D Systems Integration Conference (3DIC), 2019

2017
Thermal impact of extreme die thinning in bump-bonded three-dimensional integrated circuits.
Microelectron. Reliab., 2017

Designing Efficient Parallel Processing in 3D Standard-Chip Stacking System with Standard Bus.
Proceedings of the 11th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip, 2017

2016
Impact of thinning stacked dies on the thermal resistance of bump-bonded three-dimensional integrated circuits.
Microelectron. Reliab., 2016

Validation of TSV thermo-mechanical simulation by stress measurement.
Microelectron. Reliab., 2016

Fabrication and stress analysis of annular-trench-isolated TSV.
Microelectron. Reliab., 2016

Wet cleaning process for high-yield via-last TSV formation.
Proceedings of the 2016 IEEE International 3D Systems Integration Conference, 2016

2015
Impact of die thinning on the thermal performance of a central TSV bus in a 3D stacked circuit.
Microelectron. J., 2015

Investigation of effects of metalization on heat spreading in bump-bonded 3D systems.
Proceedings of the 2015 International 3D Systems Integration Conference, 2015

Twice-etched silicon approach for via-last through-silicon-via with a Parylene-HT liner.
Proceedings of the 2015 International 3D Systems Integration Conference, 2015

Guard-ring monitoring system for inspecting defects in TSV-based data buses.
Proceedings of the 2015 International 3D Systems Integration Conference, 2015

2014
Copper filled TSV formation with Parylene-HT insulator for low-temperature compatible 3D integration.
Proceedings of the 2014 International 3D Systems Integration Conference, 2014

Ultrawideband ultralow PDN impedance of decoupling capacitor embedded interposers using narrow gap chip parts mounting technology for 3-D integrated LSI system.
Proceedings of the 2014 International 3D Systems Integration Conference, 2014

Analysis of thermal stress distribution for TSV with novel structure.
Proceedings of the 2014 International 3D Systems Integration Conference, 2014

Substrate monitoring system for inspecting defects in TSV-based data buses.
Proceedings of the 2014 International 3D Systems Integration Conference, 2014

2013
Investigation of optimized high-density flip-chip interconnect design including micro Au bumps for 3-D stacked LSI packaging.
Proceedings of the 2013 IEEE International 3D Systems Integration Conference (3DIC), 2013

New optical three dimensional structure measurement method of cone shape micro bumps used for 3D LSI chip stacking.
Proceedings of the 2013 IEEE International 3D Systems Integration Conference (3DIC), 2013

2011
COOL interconnect low power interconnection technology for scalable 3D LSI design.
Proceedings of the 2011 IEEE Symposium on Low-Power and High-Speed Chips, 2011

PDN impedance analysis of TSV-decoupling capacitor embedded Silicon interposer for 3D-integrated CMOS image sensor system.
Proceedings of the 2011 IEEE International 3D Systems Integration Conference (3DIC), Osaka, Japan, January 31, 2011

Hot spots suppression by high thermal conductivity film in thin-sub strate CMOS ICs for 3D integration.
Proceedings of the 2011 IEEE International 3D Systems Integration Conference (3DIC), Osaka, Japan, January 31, 2011

2009
SrTiO3 thin film decoupling capacitors on Si interposers for 3D system integration.
Proceedings of the IEEE International Conference on 3D System Integration, 2009

Ultralow impedance evaluation system of wideband frequency for power distribution network of decoupling capacitor embedded substrates.
Proceedings of the IEEE International Conference on 3D System Integration, 2009

2008
Chemical flip-chip bonding method for fabricating 10-µm-pad-pitch interconnect.
IEICE Electron. Express, 2008

2006
Band-Stop Filter Effect of Power/Ground Plane on Through-Hole Signal Via in Multilayer PCB.
IEICE Trans. Electron., 2006


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