Fan Yang

Junxia Ma

Mohammad Tehranipoor

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Silicon evaluation of faster than at-speed transition delay tests.

[BibT_eX]

[DOI]

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2010

Testing of latch based embedded arrays using scan tests.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Improving the Detectability of Resistive Open Faults in Scan Cells.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

Detectability of internal bridging faults in scan chains.

[BibT_eX]

[DOI]

Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009

2008

On the Detectability of Scan Chain Internal Faults - An Industrial Case Study.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Detection of Internal Stuck-open Faults in Scan Chains.

[BibT_eX]

[DOI]

Proceedings of the 2008 IEEE International Test Conference, 2008

An Enhanced Logic BIST Architecture for Online Testing.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells.

[BibT_eX]

[DOI]