D. S. Huang

According to our database1, D. S. Huang authored at least 5 papers between 2018 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2024
A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through Different Model Verification for More than Moore Diversity Application.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2022
AC TDDB Analysis for HK/IL Gate Stack Breakdown and Frequency-dependent Oxygen Vacancy Trap Generation in Advanced nodes FinFET Devices by SILC Spectrum Methodology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2018
Study of dynamic TDDB in scaled FinFET technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Comprehensive device and product level reliability studies on advanced CMOS technologies featuring 7nm high-k metal gate FinFET transistors.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018


  Loading...