Byoung Hun Lee

According to our database, Byoung Hun Lee authored at least 10 papers between 2004 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration.

Seung-Mo Kim, Thi Mi Hanh Nyugen, Jungwon Oh, Yongsu Lee, Soo Cheol Kang, Ho-In Lee, Cihyun Kim, Surajit Some, Hyeon Jun Hwang, Byoung Hun Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Extreme Low Power Technology using Ternary Arithmetic Logic Circuits via Drastic Interconnect Length Reduction.

Kiyung Kim, Sunmean Kim, Yongsu Lee, Daeyeon Kim, So-Young Kim, Seokhyeong Kang, Byoung Hun Lee

Proceedings of the 50th IEEE International Symposium on Multiple-Valued Logic, 2020

2019

Demonstration of ternary devices and circuits using dual channel graphene barristors.

So-Young Kim, Sunwoo Heo, Kiyung Kim, Myungwoo Son, Seung-Mo Kim, Ho-In Lee, Yongsu Lee, Hyeon Jun Hwang, Moon-Ho, Byoung Hun Lee

Proceedings of the 2019 IEEE 49th International Symposium on Multiple-Valued Logic (ISMVL), 2019

2018

Reliability characteristics of MIM capacitor studied with ΔC-F characteristics.

Soo Cheol Kang, Sang Kyung Lee, S. Heo, S. M. Kim, Sung Kwan Lim, Byoung Hun Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016

Design of Ratioless Ternary Inverter Using Graphene Barristor.

Sunwoo Heo, Jinwoo Noh, Yun Ji Kim, So-Young Kim, Abdul Karim Khan, Byoung Hun Lee

Proceedings of the 46th IEEE International Symposium on Multiple-Valued Logic, 2016

2015

Neuromorphic Hardware System for Visual Pattern Recognition With Memristor Array and CMOS Neuron.

Myonglae Chu, Byoungho Kim, Sangsu Park, Hyunsang Hwang, Moongu Jeon, Byoung Hun Lee, Byung-Geun Lee

IEEE Trans. Ind. Electron., 2015

Metal Decoration Effects on the Gas-Sensing Properties of 2D Hybrid-Structures on Flexible Substrates.

Byungjin Cho, Jongwon Yoon, Sung Kwan Lim, Ah Ra Kim, Sun-Young Choi, Dong-Ho Kim, Kyu-Hwan Lee, Byoung Hun Lee, Heung Cho Ko, Myung Gwan Hahm

Sensors, 2015

2007

Electrical characterization and analysis techniques for the high-kappa era.

Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker

Microelectron. Reliab., 2007

2005

Probing stress effects in HfO₂ gate stacks with time dependent measurements.

Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff

Microelectron. Reliab., 2005

2004

Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics.

Gennadi Bersuker, Jang H. Sim, Chadwin D. Young, Rino Choi, Peter Zeitzoff, George A. Brown, Byoung Hun Lee, Robert W. Murto

Microelectron. Reliab., 2004