Andrea Vici

According to our database1, Andrea Vici authored at least 7 papers between 2019 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
SILC and TDDB reliability of novel low thermal budget RMG gate stacks.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
Analysis of TDDB lifetime projection in low thermal budget HfO2/SiO2 stacks for sequential 3D integrations.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2019
Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and impact on reliability.
Proceedings of the 49th European Solid-State Device Research Conference, 2019


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