Zuocheng Cai
According to our database1,
Zuocheng Cai
authored at least 2 papers
between 2023 and 2024.
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Bibliography
2024
Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited).
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
HZO Scaling and Fatigue Recovery in FeFET with Low Voltage Operation: Evidence of Transition from Interface Degradation to Ferroelectric Fatigue.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023