Zoran Prijic

According to our database, Zoran Prijic authored at least 8 papers between 2010 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering.

Danijel Dankovic, Milos Marjanovic, Nikola Mitrovic, Emilija Zivanovic, Milan Dankovic, Aneta Prijic, Zoran Prijic

IEEE Trans. Educ., April, 2023

2022

Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress.

Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic

J. Circuits Syst. Comput., December, 2022

2019

Influence of Encryption Algorithms on Power Consumption in Energy Harvesting Systems.

Ljubomir Vracar, Milan D. Stojanovic, Aleksandar S. Stanimirovic, Zoran Prijic

J. Sensors, 2019

2018

NBTI and irradiation related degradation mechanisms in power VDMOS transistors.

Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic

Microelectron. Reliab., 2018

A review of pulsed NBTI in P-channel power VDMOSFETs.

Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Ninoslav Stojadinovic

Microelectron. Reliab., 2018

2013

An Electromechanical Approach to a Printed Circuit Board Design Course.

Danijel Dankovic, Ljubomir Vracar, Aneta Prijic, Zoran Prijic

IEEE Trans. Educ., 2013

2011

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.

Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic

Microelectron. Reliab., 2011

2010

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.

Ninoslav Stojadinovic, Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic

Microelectron. Reliab., 2010