Zongli Shen

According to our database, Zongli Shen authored at least 4 papers between 2019 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Joint Feature and Label Adversarial Network for Wafer Map Defect Recognition.

Jianbo Yu, Zongli Shen, Xiaoyun Zheng

IEEE Trans Autom. Sci. Eng., 2021

Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest.

Jianbo Yu, Zongli Shen, Shijin Wang

Eng. Appl. Artif. Intell., 2021

Deep transfer Wasserstein adversarial network for wafer map defect recognition.

Jianbo Yu, Shijin Li, Zongli Shen, Shijin Wang, Changhui Liu, Qingfeng Li

Comput. Ind. Eng., 2021

2019

Wafer Map Defect Recognition Based on Deep Transfer Learning.

Zongli Shen, Jianbo Yu

Proceedings of the 2019 IEEE International Conference on Industrial Engineering and Engineering Management, 2019