Ziyang Ye

According to our database, Ziyang Ye authored at least 10 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2025

SLAM2: Simultaneous Localization and Multimode Mapping for indoor dynamic environments.

Zhihao Lin, Qi Zhang, Zhen Tian, Peizhuo Yu, Ziyang Ye, Hanyang Zhuang, Jianglin Lan

Pattern Recognit., 2025

2024

De-Correlation and De-Bias Post-Processing Circuits for True Random Number Generator.

Ruilin Zhang, Haochen Zhang, Xingyu Wang, Ziyang Ye, Kunyang Liu, Shinichi Nishizawa, Kiichi Niitsu, Hirofumi Shinohara

IEEE Trans. Circuits Syst. I Regul. Pap., November, 2024

Current Reconstruction and Sag/Wind Deflection Monitoring of Transmission Lines by Magnetic Sensing.

Yalong Mai, Yankai Xing, Ziyang Ye, Guangdou Zhang, Jian Li

IEEE Trans. Instrum. Meas., 2024

Method of High-Precision Digital Slope-Trigger in High-Speed Data Acquisition System.

Chengyang Li, Shulin Tian, Wuhuang Huang, Kuojun Yang, Peng Ye, Ziyang Ye

IEEE Trans. Instrum. Meas., 2024

Route recommendation method for frequent passengers in subway based on passenger preference ranking.

Xinyue Xu, Xiaoran Wang, Ziyang Ye, Anzhong Zhang, Jun Liu, Linqi Xia, Zinuo Li, Benxiang Feng

Expert Syst. Appl., 2024

A Conflicts-free, Speed-lossless KAN-based Reinforcement Learning Decision System for Interactive Driving in Roundabouts.

Zhihao Lin, Zhen Tian, Qi Zhang, Ziyang Ye, Hanyang Zhuang, Jianglin Lan

CoRR, 2024

2023

Uncertainty-aware U-Net for Medical Landmark Detection.

Ziyang Ye, Haiyang Yu, Bin Li

CoRR, 2023

Dynamic Digital Circuit Locking (DDCL): A Shield against Static Analysis Attacks.

Ziyang Ye, Makoto Ikeda

Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

Practical Markov Chain and Von Neumann based Post-processing Circuits for True Random Number Generators.

Ruilin Zhang, Haochen Zhang, Xingyu Wang, Ziyang Ye, Kunyang Liu, Hirofumi Shinohara

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Assessing the Vulnerability of Time-Controlled Logic-Loop-Based Circuits to Voltage Fault Injection and Power Monitoring Attacks.

Ziyang Ye, Makoto Ikeda

Proceedings of the International Conference on IC Design and Technology, 2023