Zixuan Sun

According to our database, Zixuan Sun authored at least 13 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

A 4-bit Calibration-Free Computing-In-Memory Macro With 3T1C Current-Programed Dynamic-Cascode Multi-Level-Cell eDRAM.

Jiahao Song, Xiyuan Tang, Haoyang Luo, Haoyi Zhang, Xin Qiao, Zixuan Sun, Xiangxing Yang, Zihan Wu, Yuan Wang, Runsheng Wang, Ru Huang

IEEE J. Solid State Circuits, March, 2024

OS³Flow: Optical and SAR Image Registration Using Symmetry-Guided Semi-Dense Optical Flow.

Zixuan Sun, Shuaifeng Zhi, Kai Huo, Xuecong Liu, Weidong Jiang, Yongxiang Liu

IEEE Geosci. Remote. Sens. Lett., 2024

Deep Learning-Assisted Trap Extraction Method from Noise Power Spectral Density for MOSFETs.

Jinghan Xu, Zheng Zhou, Mengqi Fan, Zixuan Sun, Shuhan Wang, Zili Tang, Fei Liu, Xiaoyan Liu

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification.

Da Wang, Yongkang Xue, Yong Liu, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

New Insights into the Random Telegraph Noise (RTN) in FinFETs at Cryogenic Temperature.

Zirui Wang, Haoran Wang, Yuxiao Wang, Zixuan Sun, Lang Zeng, Runsheng Wang, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs.

Zixuan Sun, Yongkang Xue, Haoran Lu, Pengpeng Ren, Zirui Wang, Zhigang Ji, Runsheng Wang, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Accelerating Device-Circuit Self-Heating Simulations with Dynamic Time Evolution for GAAFET.

Sihao Chen, Yu Li, Baokang Peng, Zixuan Sun, Lining Zhang, Runsheng Wang, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Glance, Focus and Refinement Network for Remote Sensing Change Detection.

Hao Zhang, Zixuan Sun, Yuhui Zheng, Kaihua Zhang, Gang Dong, Lingyan Liang, Yaqian Zhao

Proceedings of the IEEE International Conference on Acoustics, 2024

Segment Anything Model Guided Semantic Knowledge Learning For Remote Sensing Change Detection.

Zixuan Sun, Huihui Song, Kaihua Zhang, Gang Dong, Lingyan Liang, Yaqian Zhao

Proceedings of the IEEE International Conference on Acoustics, 2024

2023

Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.

Zuoyuan Dong, Zixuan Sun, Xin Yang, Xiaomei Li, Yongkang Xue, Chen Luo, Puyang Cai, Zirui Wang, Shuying Wang, Yewei Zhang, Chaolun Wang, Pengpeng Ren, Zhigang Ji, Xing Wu, Runsheng Wang, Ru Huang

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation.

Longda Zhou, Jie Li, Zheng Qiao, Pengpeng Ren, Zixuan Sun, Jianping Wang, Blacksmith Wu, Zhigang Ji, Runsheng Wang, Kanyu Cao, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology.

Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2023

A Calibration-Free 15-level/Cell eDRAM Computing-in-Memory Macro with 3T1C Current-Programmed Dynamic-Cascoded MLC achieving 233-to-304-TOPS/W 4b MAC.

Jiahao Song, Xiyuan Tang, Haoyang Luo, Haoyi Zhang, Xin Qiao, Zixuan Sun, Xiangxing Yang, Yuan Wang, Runsheng Wang, Ru Huang

Proceedings of the IEEE Custom Integrated Circuits Conference, 2023