Zhuo Zhang

According to our database, Zhuo Zhang authored at least 6 papers between 2005 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2014

On achieving minimal size test sets for scan designs.

Sudhakar M. Reddy, Zhuo Zhang

it Inf. Technol., 2014

2007

Enhancing delay fault coverage through low-power segmented scan.

Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Bashir M. Al-Hashimi

IET Comput. Digit. Tech., 2007

Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes.

Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 12th Conference on Asia South Pacific Design Automation, 2007

2006

Scan Tests with Multiple Fault Activation Cycles for Delay Faults.

Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs.

Santiago Remersaro, Xijiang Lin, Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

On Generating Pseudo-Functional Delay Fault Tests for Scan Designs.

Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005