Zhouzhouzhou Mei

According to our database, Zhouzhouzhou Mei authored at least 4 papers between 2024 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of six.

2025

SCSNet: a novel transformer-CNN fusion architecture for enhanced segmentation and classification on high-resolution semiconductor micro-scale defects.

Yuening Luo, Zhouzhouzhou Mei, Yibo Qiao, Yining Chen

Appl. Intell., April, 2025

A novel joint segmentation approach for wafer surface defect classification based on blended network structure.

Zhouzhouzhou Mei, Yuening Luo, Yibo Qiao, Yining Chen

J. Intell. Manuf., March, 2025

DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture.

Lichao Zeng, Zhouzhouzhou Mei, Zhongyu Shi, Yining Chen

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024

DeepSEM-Net: Enhancing SEM defect analysis in semiconductor manufacturing with a dual-branch CNN-Transformer architecture.

Yibo Qiao, Zhouzhouzhou Mei, Yuening Luo, Yining Chen

Comput. Ind. Eng., 2024