Zhouzhouzhou Mei

Orcid: 0009-0003-7209-1722

According to our database¹, Zhouzhouzhou Mei authored at least 3 papers between 2024 and 2025.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of six.

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Bibliography

2025

SCSNet: a novel transformer-CNN fusion architecture for enhanced segmentation and classification on high-resolution semiconductor micro-scale defects.

[BibT_eX]

[DOI]

Appl. Intell., April, 2025

DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture.

[BibT_eX]

[DOI]

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024

DeepSEM-Net: Enhancing SEM defect analysis in semiconductor manufacturing with a dual-branch CNN-Transformer architecture.

[BibT_eX]

[DOI]

Comput. Ind. Eng., 2024

Zhouzhouzhou Mei

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