Zhigang Ji
Orcid: 0009-0000-3776-1071
According to our database1,
Zhigang Ji
authored at least 63 papers
between 2009 and 2024.
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Bibliography
2024
High-Throughput Addressable Test Structure Design for Nano-Scaled CMOS Device Characterization.
IEEE Trans. Circuits Syst. II Express Briefs, September, 2024
Fast Aging-Aware Timing Analysis Framework With Temporal-Spatial Graph Neural Network.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., June, 2024
DRGA-Based Second-Order Block Arnoldi Method for Model Order Reduction of MIMO RCS Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap., May, 2024
Knowl. Based Syst., 2024
Infinite-LLM: Efficient LLM Service for Long Context with DistAttention and Distributed KVCache.
CoRR, 2024
A strong physical unclonable function with machine learning immunity for Internet of Things application.
Sci. China Inf. Sci., 2024
Understanding the Physical Mechanism of RowPress at the Device-Level in Sub-20 nm DRAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
A Thermal Profile Prediction Methodology for Nanosheet Circuits Featuring Cross-Layer Thermal Coupling Effect.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the International Joint Conference on Neural Networks, 2024
Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024
CrossBind: Collaborative Cross-Modal Identification of Protein Nucleic-Acid-Binding Residues.
Proceedings of the Thirty-Eighth AAAI Conference on Artificial Intelligence, 2024
2023
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., December, 2023
A Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis.
ACM Trans. Design Autom. Electr. Syst., July, 2023
Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2023
Efficient Aging-Aware Standard Cell Library Characterization Based on Sensitivity Analysis.
IEEE Trans. Circuits Syst. II Express Briefs, February, 2023
Towards Accurate Oriented Object Detection in Aerial Images with Adaptive Multi-level Feature Fusion.
ACM Trans. Multim. Comput. Commun. Appl., January, 2023
Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Proceedings of the ACM SIGCOMM 2023 Conference, 2023
Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps.
Proceedings of the 15th IEEE International Conference on ASIC, 2023
2022
A Space-Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors.
Sci. China Inf. Sci., 2022
Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Towards a more efficient few-shot learning-based human gesture recognition via dynamic vision sensors.
Proceedings of the 33rd British Machine Vision Conference 2022, 2022
2021
Fast Video Facial Expression Recognition by a Deeply Tensor-Compressed LSTM Neural Network for Mobile Devices.
ACM Trans. Internet Things, 2021
On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude.
IEEE Access, 2021
Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing.
IEEE Access, 2021
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Proceedings of the International Conference on IC Design and Technology, 2021
An integrated method for extracting the statistical distribution of RTN time constants.
Proceedings of the 14th IEEE International Conference on ASIC, 2021
2020
Appl. Soft Comput., 2020
An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants.
IEEE Access, 2020
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities.
Sci. China Inf. Sci., 2019
Proceedings of the International Conference on IC Design and Technology, 2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2018
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction.
Microelectron. Reliab., 2018
2017
3D Fabric: Differential Deceleration and Detour for Congestion Free Data Center Networks.
Proceedings of the Posters and Demos Proceedings of the Conference of the ACM Special Interest Group on Data Communication, 2017
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage.
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2015
Non-Real-Time Network Traffic in Software-Defined Networking: A Link Bandwidth Prediction-Based Algorithm.
Comput. Inf. Sci., 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015
2014
Microelectron. Reliab., 2014
Proceedings of the 11th IEEE International Conference on Mobile Ad Hoc and Sensor Systems, 2014
2010
The Research on Modeling Document Summarization for Audio-Based Knowledge Management.
J. Softw., 2010
2009
Proceedings of the Second International Workshop on Knowledge Discovery and Data Mining, 2009
Proceedings of the 2009 IITA International Conference on Services Science, 2009
Evaluate the Selection of Logistics Centre Location Using SVM Based on Principal Component Analysis.
Proceedings of the 2009 Pacific-Asia Conference on Circuits, Communications and Systems, 2009
Evaluation of Management Information System Based on Fuzzy AHP and Multiple Matter Elements.
Proceedings of the 2009 Pacific-Asia Conference on Circuits, Communications and Systems, 2009