Zhenghao Gan
According to our database1,
Zhenghao Gan
authored at least 7 papers
between 2005 and 2023.
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Bibliography
2023
Proceedings of the Advances in Computer Graphics, 2023
2018
New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2014
New insight on negative bias temperature instability degradation with drain bias of 28 nm High-K Metal Gate p-MOSFET devices.
Microelectron. Reliab., 2014
2012
Applications of finite element methods for reliability study of ULSI interconnections.
Microelectron. Reliab., 2012
2006
Microelectron. Reliab., 2006
2005
Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications.
Microelectron. Reliab., 2005