Zheng Shi
Orcid: 0000-0003-4952-9389Affiliations:
- Zhejiang University, Institute of VLSI Design, Hangzhou, China
According to our database1,
Zheng Shi
authored at least 24 papers
between 2005 and 2021.
Collaborative distances:
Collaborative distances:
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Bibliography
2021
A BJT-Based CMOS Temperature Sensor With Duty-Cycle-Modulated Output and ±0.5°C (3σ) Inaccuracy From -40 °C to 125 °C.
IEEE Trans. Circuits Syst. II Express Briefs, 2021
A 1-V Diode-Based Temperature Sensor with a Resolution FoM of 3.1pJ•K<sup>2</sup> in 55nm CMOS.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2021
2020
A Dynamic-Biased Resistor-Based CMOS Temperature Sensor With a Duty-Cycle-Modulated Output.
IEEE Trans. Circuits Syst. II Express Briefs, 2020
A 1770-µm<sup>2</sup> Leakage-Based Digital Temperature Sensor With Supply Sensitivity Suppression in 55-nm CMOS.
IEEE J. Solid State Circuits, 2020
2019
A Reliability-Oriented Startup Analysis of Injection-Locked Frequency Divider Based on Broken Symmetry Theory.
IEEE Trans. Very Large Scale Integr. Syst., 2019
An Untrimmed BJT-Based Temperature Sensor With Dynamic Current-Gain Compensation in 55-nm CMOS Process.
IEEE Trans. Circuits Syst. II Express Briefs, 2019
2018
A CMOS Temperature Sensor With Versatile Readout Scheme and High Accuracy for Multi-Sensor Systems.
IEEE Trans. Circuits Syst. I Regul. Pap., 2018
A 2.4 mW 2.5 GHz multi-phase clock generator with duty cycle imbalance correction in 0.13 µm CMOS.
Integr., 2018
IEEE Commun. Lett., 2018
2017
A novel layout automation flow to facilitate test chip design for standard cell characterization.
Proceedings of the 12th IEEE International Conference on ASIC, 2017
Design and automatic generation of area-efficient ring oscillator based addressable test chips.
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2015
Fast Level-Set-Based Inverse Lithography Algorithm for Process Robustness Improvement and Its Application.
J. Comput. Sci. Technol., 2015
J. Electron. Test., 2015
2014
J. Zhejiang Univ. Sci. C, 2014
2013
J. Zhejiang Univ. Sci. C, 2013
A New Level-Set-Based Inverse Lithography Algorithm for Process Robustness Improvement with Attenuated Phase Shift Mask.
Proceedings of the 2013 International Conference on Computer-Aided Design and Computer Graphics, 2013
2012
J. Zhejiang Univ. Sci. C, 2012
2011
Erratum to: A sparse matrix model-based optical proximity correction algorithm with model-based mapping between segments and control sites.
J. Zhejiang Univ. Sci. C, 2011
A sparse matrix model-based optical proximity correction algorithm with model-based mapping between segments and control sites.
J. Zhejiang Univ. Sci. C, 2011
Using NMOS transistors as switches for accuracy and area-efficiency in large-scale addressable test array.
Proceedings of the 12th International Symposium on Quality Electronic Design, 2011
Proceedings of the 20th European Conference on Circuit Theory and Design, 2011
2007
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007
2005
Sci. China Ser. F Inf. Sci., 2005
Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005