Zhanping Chen
Orcid: 0000-0002-2844-459X
According to our database1,
Zhanping Chen
authored at least 27 papers
between 1997 and 2022.
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Bibliography
2022
A High Output Power 1V Charge Pump and Power Switch for Configurable, In-Field-Programmable Metal eFuse on Intel 4 Logic Technology.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
2017
A 0.9-μm<sup>2</sup> 1T1R Bit Cell in 14-nm High-Density Metal Fuse Technology for High-Volume Manufacturing and In-Field Programming.
IEEE J. Solid State Circuits, 2017
2016
A High-Density Metal-Fuse Technology Featuring a 1.6 V Programmable Low-Voltage Bit Cell With Integrated 1 V Charge Pumps in 22 nm Tri-Gate CMOS.
IEEE J. Solid State Circuits, 2016
A 0.9um<sup>2</sup> 1T1R bit cell in 14nm SoC process for metal-fuse OTP array with hierarchical bitline, bit level redundancy, and power gating.
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016
2015
Low-voltage metal-fuse technology featuring a 1.6V-programmable 1T1R bit cell with an integrated 1V charge pump in 22nm tri-gate process.
Proceedings of the Symposium on VLSI Circuits, 2015
2010
A 4 kb Metal-Fuse OTP-ROM Macro Featuring a 2 V Programmable 1.37 μ m <sup>2</sup> <i>1T1R</i> Bit Cell in 32 nm High-k Metal-Gate CMOS.
IEEE J. Solid State Circuits, 2010
2009
A 3.8 GHz 153 Mb SRAM Design With Dynamic Stability Enhancement and Leakage Reduction in 45 nm High-k Metal Gate CMOS Technology.
IEEE J. Solid State Circuits, 2009
2008
A 1.1 GHz 12 µA/Mb-Leakage SRAM Design in 65 nm Ultra-Low-Power CMOS Technology With Integrated Leakage Reduction for Mobile Applications.
IEEE J. Solid State Circuits, 2008
A 153Mb-SRAM Design with Dynamic Stability Enhancement and Leakage Reduction in 45nm High-Κ Metal-Gate CMOS Technology.
Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008
2006
A 3-GHz 70-mb SRAM in 65-nm CMOS technology with integrated column-based dynamic power supply.
IEEE J. Solid State Circuits, 2006
2005
SRAM design on 65-nm CMOS technology with dynamic sleep transistor for leakage reduction.
IEEE J. Solid State Circuits, 2005
2002
IEEE Trans. Very Large Scale Integr. Syst., 2002
IEEE Des. Test Comput., 2002
2001
On effective I<sub>DDQ</sub> testing of low-voltage CMOS circuits using leakage control techniques.
IEEE Trans. Very Large Scale Integr. Syst., 2001
Comparative delay and energy of single edge-triggered & dual edge-triggered pulsed flip-flops for high-performance microprocessors.
Proceedings of the 2001 International Symposium on Low Power Electronics and Design, 2001
2000
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000
On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques.
Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000
1999
Design and optimization of dual-threshold circuits for low-voltage low-power applications.
IEEE Trans. Very Large Scale Integr. Syst., 1999
Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30, 1999
Mixed-<i>V<sub>th</sub></i> (MVT) CMOS Circuit Design Methodology for Low Power Applications.
Proceedings of the 36th Conference on Design Automation, 1999
1998
Efficient statistical approach to estimate power considering uncertain properties of primary inputs.
IEEE Trans. Very Large Scale Integr. Syst., 1998
Estimation of standby leakage power in CMOS circuits considering accurate modeling of transistor stacks.
Proceedings of the 1998 International Symposium on Low Power Electronics and Design, 1998
Estimation of power sensitivity in sequential circuits with power macromodeling application.
Proceedings of the 1998 IEEE/ACM International Conference on Computer-Aided Design, 1998
Design and Optimization of Low Voltage High Performance Dual Threshold CMOS Circuits.
Proceedings of the 35th Conference on Design Automation, 1998
Proceedings of the 35th Conference on Design Automation, 1998
Estimation of average switching power under accurate modeling of signal correlations.
Proceedings of the IEEE 1998 Custom Integrated Circuits Conference, 1998
1997
Power sensitivity - a new method to estimate power dissipation considering uncertain specifications of primary inputs.
Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, 1997