Zhanhui Shi

According to our database, Zhanhui Shi authored at least 8 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach.

Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., August, 2024

Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient.

Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou

IEEE Trans. Circuits Syst. II Express Briefs, April, 2024

A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits.

Zhanhui Shi, Jie Xiao, Weidong Zhu, Jianhui Jiang

IEEE Trans. Computers, January, 2024

2022

BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks.

Jie Xiao, Zhanhui Shi, Xuhua Yang, Jungang Lou

IEEE Trans. Computers, 2022

Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model.

Weidong Zhu, Jianhui Jiang, Zhanhui Shi

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2019

A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm.

Jie Xiao, Zhanhui Shi, Jianhui Jiang, Xu-Hua Yang, Yujiao Huang, Haigen Hu

J. Comput. Sci. Technol., 2019

Circuit reliability prediction based on deep autoencoder network.

Jie Xiao, Weifeng Ma, Jungang Lou, Jianhui Jiang, Yujiao Huang, Zhanhui Shi, Qing Shen, Xuhua Yang

Neurocomputing, 2019

2018

A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model.

Jie Xiao, Jianhui Jiang, Xiaoxin Li, Yujiao Huang, Xuhua Yang, Zhanhui Shi, Jungang Lou

IEEE Access, 2018