Zhanglei Wang
According to our database1,
Zhanglei Wang
authored at least 24 papers
between 2005 and 2012.
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2012
IEEE Trans. Very Large Scale Integr. Syst., 2012
Diagnostic system based on support-vector machines for board-level functional diagnosis.
Proceedings of the 17th IEEE European Test Symposium, 2012
2011
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks.
Proceedings of the 2011 IEEE International Test Conference, 2011
2010
A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support.
IEEE Trans. Very Large Scale Integr. Syst., 2010
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 2011 IEEE International Test Conference, 2010
Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test.
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2009
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009
Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009
Proceedings of the 2009 IEEE International Test Conference, 2009
2008
IEEE Trans. Very Large Scale Integr. Syst., 2008
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.
J. Electron. Test., 2008
2007
ACM Trans. Design Autom. Electr. Syst., 2007
J. Electron. Test., 2007
Proceedings of the 2007 IEEE International Test Conference, 2007
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression.
Proceedings of the 12th European Test Symposium, 2007
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling.
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007
2006
Test set enrichment using a probabilistic fault model and the theory of output deviations.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time.
Proceedings of the 15th Asian Test Symposium, 2006
Proceedings of the 15th Asian Test Symposium, 2006
2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the 10th European Test Symposium, 2005