Zeyun Zhao
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Bibliography
2024
An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis.
Reliab. Eng. Syst. Saf., 2024
Proceedings of the Pattern Recognition and Computer Vision - 7th Chinese Conference, 2024
Proceedings of the Knowledge Science, Engineering and Management, 2024
G2Vec: Spatial-Temporal Trajectory Generation Network based on Multi-Resolution Feature Correlation.
Proceedings of the International Joint Conference on Neural Networks, 2024
Proceedings of the IEEE International Conference on Multimedia and Expo, 2024