Zale T. Schoenborn
According to our database1,
Zale T. Schoenborn
authored at least 2 papers
between 2013 and 2014.
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Bibliography
2014
A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time.
Proceedings of the 2014 International Test Conference, 2014
2013
Comparison of hardware based and software based stress testing of memory IO interface.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013