Zahira Perez
Orcid: 0000-0002-3053-3006
According to our database1,
Zahira Perez
authored at least 2 papers
between 2018 and 2020.
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Bibliography
2020
Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells.
Proceedings of the IEEE Latin-American Test Symposium, 2020
2018
An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018