Zahava Koren

According to our database, Zahava Koren authored at least 60 papers between 1986 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of two.

2024

Image Degradation due to Interacting Hot Pixels and SEUs.

Glenn H. Chapman, Alireza Farahmandpour, Amit Chakma, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023

Image Degradation in Time Due to Interacting Hot Pixels.

Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022

Image Degradation due to Interacting Adjacent Hot Pixels.

Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Dependence of SEUs in Digital Cameras on Pixel size and Elevation.

Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2020

Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

Image degradation from hot pixel defects with pixel size shrinkage.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2019, 2019

Detecting SEUs in Noisy Digital Imagers with small pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren

Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

2018

Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2018, 2018

Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2017

Hot Pixel Behavior as Pixel Size Reduces to 1 micron.

Glenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2017, 2017

Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm.

Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

2016

Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2016, 2016

Experimental study and analysis of soft and permanent errors in digital cameras.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren

Proceedings of the 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2016

2015

Enhanced correction methods for high density hot pixel defects in digital imagers.

Glenn H. Chapman, Rahul Thomas, Rohit Thomas, Zahava Koren, Israel Koren

Proceedings of the Image Sensors and Imaging Systems 2015, 2015

Single Event Upsets and Hot Pixels in digital imagers.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

2014

Scheduling imprecise task graphs for real-time applications.

R. C. Ravindran, C. Mani Krishna, Israel Koren, Zahava Koren

Int. J. Embed. Syst., 2014

Correcting high-density hot pixel defects in digital imagers.

Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren

Proceedings of the Image Sensors and Imaging Systems 2014, 2014

Improved correction for hot pixels in digital imagers.

Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren

Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

2013

Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO.

Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren

Proceedings of the Sensors, 2013

Improved image accuracy in Hot Pixel degraded digital cameras.

Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012

Do more camera pixels result in a better picture?

Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

Cost Functions for Scheduling Tasks in Cyber-physical Systems.

Abhinna Jain, C. M. Krishna, Israel Koren, Zahava Koren

Proceedings of the ICINCO 2012 - Proceedings of the 9th International Conference on Informatics in Control, Automation and Robotics, Volume 1, Rome, Italy, 28, 2012

Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO.

Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren

Proceedings of the Sensors, 2012

Relating digital imager defect rates to pixel size, sensor area and ISO.

Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2011

Tradeoffs in imager design parameters for sensor reliability.

Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren

Proceedings of the Sensors, 2011

Predicting Pixel Defect Rates Based on Image Sensor Parameters.

Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

2010

Tradeoffs in Imager Design with Respect to Pixel Defect Rates.

Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren

Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010

2009

Event-driven adaptive duty-cycling in sensor networks.

Srikanth Sundaresan, Israel Koren, Zahava Koren, C. Mani Krishna

Int. J. Sens. Networks, 2009

Statistical identification and analysis of defect development in digital imagers.

Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren

Proceedings of the Digital Photography V, 2009

Characterization of Gain Enhanced In-Field Defects in Digital Imagers.

Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

2008

Automatic Detection of In-field eld Defect Growth in Image Sensors.

Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

2007

Identification of in-field defect development in digital image sensors.

Jozsef Dudas, Linda Wu, Cory Jung, Glenn H. Chapman, Zahava Koren, Israel Koren

Proceedings of the Digital Photography III, San Jose, CA, USA, January 29-30, 2007, 2007

Quantitative Analysis of In-Field Defects in Image Sensor Arrays.

Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

2006

On-Line Mapping of In-Field Defects in Image Sensor Arrays.

Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005

On-Line Identification of Faults in Fault-Tolerant Imagers.

Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

2004

A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction.

Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren

IEEE Des. Test Comput., 2004

Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer.

E. Ciocca, Israel Koren, Zahava Koren, C. Mani Krishna, Daniel S. Katz

Proceedings of the 10th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2004), 2004

2003

Pre-Processing Input Data to Augment Fault Tolerance in Space Applications.

Jayakrishnan Nair, Zahava Koren, Israel Koren, C. Mani Krishna

Proceedings of the 2003 International Conference on Dependable Systems and Networks (DSN 2003), 2003

2002

Using Rational Approximations for Evaluating the Reliablity of Highly Reliable Systems.

Zahava Koren, J. Rajagopal, C. Mani Krishna, Israel Koren, W. Wang, J. Loman

Proceedings of the 16th International Parallel and Distributed Processing Symposium (IPDPS 2002), 2002

2001

Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip.

Israel Koren, Zahava Koren, Glenn H. Chapman

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000

Incorporating Yield Enhancement into the Floorplanning Process.

Israel Koren, Zahava Koren

IEEE Trans. Computers, 2000

Synthesis of Interconnection Networks: A Novel Approach.

Vijay Lakamraju, Zahava Koren, C. Mani Krishna

Proceedings of the 2000 International Conference on Dependable Systems and Networks (DSN 2000) (formerly FTCS-30 and DCCA-8), 2000

A Self-Correcting Active Pixel Camera.

Israel Koren, Zahava Koren, Glenn H. Chapman

Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000

1998

Defect tolerance in VLSI circuits: techniques and yield analysis.

Israel Koren, Zahava Koren

Proc. IEEE, 1998

Measuring the Vulnerability of Interconnection Networks in Embedded Systems.

Vijay Lakamraju, Zahava Koren, Israel Koren, C. Mani Krishna

Proceedings of the Parallel and Distributed Processing, 10 IPPS/SPDP'98 Workshops Held in Conjunction with the 12th International Parallel Processing Symposium and 9th Symposium on Parallel and Distributed Processing, Orlando, Florida, USA, March 30, 1998

Surge Handling as a Measure of Real-Time System Dependability.

Zahava Koren, Israel Koren, C. Mani Krishna

Proceedings of the Parallel and Distributed Processing, 10 IPPS/SPDP'98 Workshops Held in Conjunction with the 12th International Parallel Processing Symposium and 9th Symposium on Parallel and Distributed Processing, Orlando, Florida, USA, March 30, 1998

Yield and Routing Objectives in Floorplanning.

Israel Koren, Zahava Koren

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1997

On the effect of floorplanning on the yield of large area integrated circuits.

Zahava Koren, Israel Koren

IEEE Trans. Very Large Scale Integr. Syst., 1997

Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs.

Israel Koren, Zahava Koren

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

1994

A statistical study of defect maps of large area VLSI IC's.

Israel Koren, Zahava Koren, Charles H. Stapper

IEEE Trans. Very Large Scale Integr. Syst., 1994

The Hyeti Defect Tolerant Microprocessor: A Practical Experiment and its Cost-Effectiveness Analysis.

Régis Leveugle, Zahava Koren, Israel Koren, Gabriele Saucier, Norbert Wehn

IEEE Trans. Computers, 1994

1993

A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits.

Israel Koren, Zahava Koren, Charles H. Stapper

IEEE Trans. Computers, 1993

Does the Floorplan of a Chip Affect Its Yield?

Zahava Koren, Israel Koren

Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993

1991

Discrete and Continuous Models for the Performance of Reconfigurable Multistage Systems.

Israel Koren, Zahava Koren

IEEE Trans. Computers, 1991

WDM Passive Star-Protocols and Performance Analysis.

Aura Ganz, Zahava Koren

Proceedings of the Proceedings IEEE INFOCOM '91, 1991

1988

Designing interconnection buses in VLSI and WSI for maximum yield and minimum delay.

Israel Koren, Zahava Koren, Dhiraj K. Pradhan

IEEE J. Solid State Circuits, June, 1988

Prioritized demand assignment protocols and their evaluation.

Imrich Chlamtac, Aura Ganz, Zahava Koren

IEEE Trans. Commun., 1988

On the Bandwidth of a Multi-Stage Network in the Presence of Faulty Components.

Israel Koren, Zahava Koren

Proceedings of the 8th International Conference on Distributed Computing Systems, 1988

1986

Analysis of a Class of Recovery Procedures.

Israel Koren, Zahava Koren, Stephen Y. H. Su

IEEE Trans. Computers, 1986

A model for evaluating demand assignment protocols with arbitrary workloads.

Zahava Koren, Imrich Chlamtac, Aura Ganz

Proceedings of the ACM SIGCOMM conference on Communications architectures & protocols, 1986