Zahava Koren
According to our database1,
Zahava Koren
authored at least 60 papers
between 1986 and 2024.
Collaborative distances:
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Bibliography
2024
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024
2023
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023
2022
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022
2021
Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021
2020
Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020
2019
Proceedings of the Image Sensors and Imaging Systems 2019, 2019
Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019
2018
Proceedings of the Image Sensors and Imaging Systems 2018, 2018
Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018
2017
Proceedings of the Image Sensors and Imaging Systems 2017, 2017
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017
2016
Proceedings of the Image Sensors and Imaging Systems 2016, 2016
Proceedings of the 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2016
2015
Proceedings of the Image Sensors and Imaging Systems 2015, 2015
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015
2014
Int. J. Embed. Syst., 2014
Proceedings of the Image Sensors and Imaging Systems 2014, 2014
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014
2013
Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO.
Proceedings of the Sensors, 2013
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013
2012
Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012
Cost Functions for Scheduling Tasks in Cyber-physical Systems.
Proceedings of the ICINCO 2012 - Proceedings of the 9th International Conference on Informatics in Control, Automation and Robotics, Volume 1, Rome, Italy, 28, 2012
Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO.
Proceedings of the Sensors, 2012
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012
2011
Proceedings of the Sensors, 2011
Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011
2010
Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010
2009
Proceedings of the Digital Photography V, 2009
Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009
2008
Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008
2007
Proceedings of the Digital Photography III, San Jose, CA, USA, January 29-30, 2007, 2007
Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
2006
Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006
2005
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005
2004
IEEE Des. Test Comput., 2004
Proceedings of the 10th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2004), 2004
2003
Proceedings of the 2003 International Conference on Dependable Systems and Networks (DSN 2003), 2003
2002
Using Rational Approximations for Evaluating the Reliablity of Highly Reliable Systems.
Proceedings of the 16th International Parallel and Distributed Processing Symposium (IPDPS 2002), 2002
2001
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001
2000
IEEE Trans. Computers, 2000
Proceedings of the 2000 International Conference on Dependable Systems and Networks (DSN 2000) (formerly FTCS-30 and DCCA-8), 2000
Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000
1998
Proceedings of the Parallel and Distributed Processing, 10 IPPS/SPDP'98 Workshops Held in Conjunction with the 12th International Parallel Processing Symposium and 9th Symposium on Parallel and Distributed Processing, Orlando, Florida, USA, March 30, 1998
Proceedings of the Parallel and Distributed Processing, 10 IPPS/SPDP'98 Workshops Held in Conjunction with the 12th International Parallel Processing Symposium and 9th Symposium on Parallel and Distributed Processing, Orlando, Florida, USA, March 30, 1998
Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998
1997
IEEE Trans. Very Large Scale Integr. Syst., 1997
Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997
1994
IEEE Trans. Very Large Scale Integr. Syst., 1994
The Hyeti Defect Tolerant Microprocessor: A Practical Experiment and its Cost-Effectiveness Analysis.
IEEE Trans. Computers, 1994
1993
A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits.
IEEE Trans. Computers, 1993
Does the Floorplan of a Chip Affect Its Yield?
Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993
1991
Discrete and Continuous Models for the Performance of Reconfigurable Multistage Systems.
IEEE Trans. Computers, 1991
Proceedings of the Proceedings IEEE INFOCOM '91, 1991
1988
IEEE J. Solid State Circuits, June, 1988
IEEE Trans. Commun., 1988
Proceedings of the 8th International Conference on Distributed Computing Systems, 1988
1986
Proceedings of the ACM SIGCOMM conference on Communications architectures & protocols, 1986