Z. H. Gan

According to our database, Z. H. Gan authored at least 1 paper in 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Reliability studies of barrier layers for Cu/PAE low-k interconnects.

Hung Son Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang

Microelectron. Reliab., 2006