Yuuki Uchida

According to our database, Yuuki Uchida authored at least 6 papers between 2018 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM.

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani, Kazutoshi Kobayashi

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2021

2020

Estimation of Reinforced Slope Dynamics Using ALOS-2/ PALSAR-2 and Validation by Terrestrial Laser Scanner.

Tomohito Asaka, Takashi Nonaka, Keishi Iwashita, Yuuki Uchida, Toshiro Sugimura

Proceedings of the IEEE International Geoscience and Remote Sensing Symposium, 2020

2019

Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 nm Fin-FET Process.

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Urban Thermal Environment Observation Using Himawari-8/Ahi Data.

Toshiro Sugimura, Yuuki Uchida, Keishi Iwashita

Proceedings of the 2019 IEEE International Geoscience and Remote Sensing Symposium, 2019

2018

Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET.

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii

Proceedings of the IEEE International Reliability Physics Symposium, 2018

A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process.

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2018