Yuta Kimi
According to our database1,
Yuta Kimi
authored at least 7 papers
between 2014 and 2016.
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Bibliography
2016
Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2016
2015
IEICE Trans. Electron., 2015
An accurate soft error propagation analysis technique considering temporal masking disablement.
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015
Analysis of Soft Error Propagation Considering Masking Effects on Re-Convergent Path.
Proceedings of the 24th IEEE Asian Test Symposium, 2015
2014
A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation.
IEICE Trans. Electron., 2014
A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement.
Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014
A Low-Latency DMR Architecture with Efficient Recovering Scheme Exploiting Simultaneously Copiable SRAM.
Proceedings of the ARCS 2014, 2014