Yunkun Lin

Orcid: 0000-0002-9252-1879

According to our database1, Yunkun Lin authored at least 5 papers between 2021 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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Article 
PhD thesis 
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Links

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Bibliography

2024
Built in self test (BIST) for RSFQ circuits.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

Predictive Testing for Aging in SRAMs and Mitigation.
Proceedings of the IEEE International Test Conference, 2024

2023
Design for testability (DFT) for RSFQ circuits.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023

2022
Fault-coverage Maximizing March Tests for Memory Testing.
Proceedings of the IEEE International Test Conference, 2022

2021
Metastability in Superconducting Single Flux Quantum (SFQ) Logic.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021


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