Yung-Huei Lee

According to our database, Yung-Huei Lee authored at least 8 papers between 2001 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Composition Segregation of Ge-Rich GST and Its Effect on Reliability.

Yung-Huei Lee, P. J. Liao, Vincent Hou, Dawei Heh, Chih-Hung Nien, Wen-Hsien Kuo, Gary T. Chen, Shao-Ming Yu, Yu-Sheng Chen, Jau-Yi Wu, Xinyu Bao, Carlos H. Diaz

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications.

Shih-che Hung, Shih-Chang Chen, Pei-Shan Chien, Yu-Sheng Cho, Yung-Huei Lee, Wei-Shuo Hung

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019

A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates.

Kaustubh Joshi, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability.

Subhadeep Mukhopadhyay, Yung-Huei Lee, Jen-Hao Lee

Microelectron. Reliab., 2018

Study of dynamic TDDB in scaled FinFET technologies.

Kaustubh Joshi, Shu-Wen Chang, D. S. Huang, P. J. Liao, Yung-Huei Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2006

Robust Inductor Design for RF Circuits.

Yin-Lung Ryan Lu, Yung-Huei Lee, William J. Mcmahon, Tze-Ching Fung

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

2005

The impact of PMOST bias-temperature degradation on logic circuit reliability performance.

Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal R. Mielke, Ramez Nachman

Microelectron. Reliab., 2005

2001

Effect of trench edge on pMOSFET reliability.

Yung-Huei Lee, Tom Linton, Ken Wu, Neal R. Mielke

Microelectron. Reliab., 2001