Yunfei En

According to our database, Yunfei En authored at least 17 papers between 2008 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A Composite Probe Capable of Simultaneously Measuring Two Orthogonal Magnetic-Fields.

Lei Wang, Xiaoxian Liu, Yunfei En, Zhangming Zhu

IEEE Trans. Circuits Syst. II Express Briefs, February, 2023

2022

An Ultrawideband Multicomponent Differential Magnetic Probe for Near-Field Scanning.

Lei Wang, Yunfei En, Zhangming Zhu

IEEE Trans. Circuits Syst. II Express Briefs, 2022

2021

Area-Efficient Extended 3-D Inductor Based on TSV Technology for RF Applications.

Chenbing Qu, Zhangming Zhu, Yunfei En, Liwei Wang, Xiaoxian Liu

IEEE Trans. Very Large Scale Integr. Syst., 2021

Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs.

Chao Peng, Rui Gao, Zhifeng Lei, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang

IEEE Access, 2021

2020

Broadband Circularly Polarized Cross-Dipole Antenna With Multiple Modes.

Lei Wang, Wenxiao Fang, Wei-Heng Shao, Bin Yao, Yun Huang, Yunfei En

IEEE Access, 2020

Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET.

Chao Peng, Zhifeng Lei, Rui Gao, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang

IEEE Access, 2020

A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.

Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Wideband Circularly Polarized Cross-Dipole Antenna With Parasitic Elements.

Lei Wang, Wenxiao Fang, Yunfei En, Yun Huang, Wei-Heng Shao, Bin Yao

IEEE Access, 2019

Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2.

Xiaolei Ma, Xiangwei Jiang, Jiezhi Chen, Liwei Wang, Yunfei En

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack.

Yueyang Liu, Xiangwei Jiang, Liwei Wang, Yunfei En, Runsheng Wang

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

The experimental analysis and the mechanical model for the debonding failure of TSV-Cu/Si interface.

Si Chen, Zhizhe Wang, Yunfei En, Yun Huang, Fei Qin, Tong An

Microelectron. Reliab., 2018

2017

Movable Noncontact RF Current Measurement on a PCB Trace.

Haimi Qiu, Wenxiao Fang, Yunfei En, Yun Huang, Yuan Liu, Ping Lai, Yiqiang Chen, Chunlei Shi

IEEE Trans. Instrum. Meas., 2017

Radiation induced transconductance overshoot in the 130 nm partially-depleted SOI MOSFETs.

Chao Peng, Yunfei En, Zhengxuan Zhang, Yuan Liu, Zhifeng Lei

Microelectron. Reliab., 2017

Quality Evaluation of Digital Soft IP Core for FPGA System.

Dengyun Lei, Liwei Wang, Jun Lin, Yunfei En

Proceedings of the 2017 IEEE International Conference on Software Quality, 2017

2015

A failure physics model for hardware Trojan detection based on frequency spectrum analysis.

Chunhua He, Bo Hou, Liwei Wang, Yunfei En, Shaofeng Xie

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2010

Total-dose-induced edge effect in SOI NMOS transistors with different layouts.

Jie Liu, Jicheng Zhou, Hongwei Luo, Xuedong Kong, Yunfei En, Qian Shi, Yujuan He

Microelectron. Reliab., 2010

2008

The irradiation effect of DC-DC power converter under X-ray.

Yunfei En, Yujuan He, Hongwei Luo, Qian Shi, Xianjun Kuang, Zhijian Pan

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008