Yuming Zhuang

According to our database, Yuming Zhuang authored at least 19 papers between 2015 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing.

Yuming Zhuang, Benjamin Magstadt, Tao Chen, Degang Chen

IEEE Trans. Instrum. Meas., 2018

Cost-Effective High Purity Signal Generator Using Pre-distortion.

Yuming Zhuang, Degang Chen

Proceedings of the IEEE International Test Conference in Asia, 2018

Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test.

Yuming Zhuang, Degang Chen

Proceedings of the IEEE International Test Conference in Asia, 2018

Cost-effective accurate DAC-ADC co-testing and DAC linearization.

Yuming Zhuang, Degang Chen

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME).

Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

2017

Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency.

Yuming Zhuang, Li Xu, Degang Chen

IEEE Trans. Instrum. Meas., 2017

Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion.

Yuming Zhuang, Degang Chen

IEEE Trans. Instrum. Meas., 2017

Accurate Spectral Testing With Non-Coherent Sampling for Multi-Tone Test.

Yuming Zhuang, Degang Chen

IEEE Trans. Circuits Syst. II Express Briefs, 2017

ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling.

Yuming Zhuang, Degang Chen

J. Electron. Test., 2017

Accurate and robust spectral testing with relaxed instrumentation requirements.

Yuming Zhuang, Degang Chen

Proceedings of the IEEE International Test Conference, 2017

Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter.

Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen

Proceedings of the IEEE International Test Conference, 2017

Accurate spectral testing of the signals with amplitude drift.

Yuming Zhuang, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

2016

Accurate Spectral Testing With Impure Source and Noncoherent Sampling.

Benjamin Magstadt, Yuming Zhuang, Degang Chen

IEEE Trans. Instrum. Meas., 2016

New Strategies in Removing Noncoherency From Signals With Large Distortion-to-Noise Ratios.

Yuming Zhuang, Degang Chen

IEEE Trans. Circuits Syst. II Express Briefs, 2016

Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.

Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Accurate spectral testing with non-coherent sampling for large distortion to noise ratios.

Yuming Zhuang, Degang Chen

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Low cost ultra-pure sine wave generation with self calibration.

Yuming Zhuang, Akhilesh Kesavan Unnithan, Arun Joseph, Siva Sudani, Benjamin Magstadt, Degang Chen

Proceedings of the 2016 IEEE International Test Conference, 2016

New strategies in removing non-coherency from signals with large distortion to noise ratios.

Yuming Zhuang, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015

Effect of flicker noise on SEIR for accurate ADC linearity testing.

Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015