Yuichiro Mitani

According to our database, Yuichiro Mitani authored at least 9 papers between 2012 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Further Investigation on Mechanism of Trap Level Modulation in Silicon Nitride Films by Fluorine Incorporation.

Harumi Seki, Yasushi Nakasaki, Yuichiro Mitani

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Study on mechanism of thermal curing in ultra-thin gate dielectrics.

Yuichiro Mitani, Yusuke Higashi, Yasushi Nakasaki

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation.

Takao Marukame, Kodai Ueyoshi, Tetsuya Asai, Masato Motomura, Alexandre Schmid, Masamichi Suzuki, Yusuke Higashi, Yuichiro Mitani

IEEE Trans. Circuits Syst. II Express Briefs, 2017

Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface.

Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe

Microelectron. Reliab., 2017

Physically unclonable function using initial waveform of ring oscillators on 65 nm CMOS technology.

Tetsufumi Tanamoto, Satoshi Takaya, Nobuaki Sakamoto, Hirotsugu Kasho, Shinichi Yasuda, Takao Marukame, Shinobu Fujita, Yuichiro Mitani

CoRR, 2017

2015

Simple technique for prediction of breakdown voltage of ultrathin gate insulator under ESD testing.

Yuichiro Mitani, Kazuya Matsuzawa

Proceedings of the 2015 International Conference on IC Design & Technology, 2015

2013

Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.

Izumi Hirano, Yasushi Nakasaki, Shigeto Fukatsu, Masakazu Goto, Koji Nagatomo, Seiji Inumiya, Katsuyuki Sekine, Yuichiro Mitani, Kikuo Yamabe

Microelectron. Reliab., 2013

Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits.

Masamichi Suzuki, Atsuhiro Kinoshita, Yuichiro Mitani

Proceedings of 2013 International Conference on IC Design & Technology, 2013

2012

Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component.

Yuichiro Mitani, Shigeto Fukatsu, Daisuke Hagishima, Kazuya Matsuzawa

Proceedings of the IEEE International Conference on IC Design & Technology, 2012