Yuhang Lan
Orcid: 0009-0005-5071-943XTimeline
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Bibliography
2023
Neural Networks, 2023
A Deep Learning Based End-to-end Surface Defect Detection Method for Industrial Scenes.
Proceedings of the 3rd International Conference on Bioinformatics and Intelligent Computing, 2023
Proceedings of the Thirty-Seventh AAAI Conference on Artificial Intelligence, 2023