Yuekai Liu
Orcid: 0000-0002-3851-9487
According to our database1,
Yuekai Liu
authored at least 16 papers
between 2020 and 2024.
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Bibliography
2024
Hybrid machine condition monitoring based on interpretable dual tree methods using Wasserstein metrics.
Expert Syst. Appl., January, 2024
Comparative Study for Different Loop-Filter Architectures of 2x Time-Interleaved CT DSM.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024
2023
A Two-Channel Time-Interleaved Continuous-Time Third-Order CIFF-Based Delta-Sigma Modulator.
IEEE Trans. Circuits Syst. I Regul. Pap., December, 2023
Matching contrastive learning: An effective and intelligent method for wind turbine fault diagnosis with imbalanced SCADA data.
Expert Syst. Appl., August, 2023
A Novel Evaluation Metric Based on Dispersion of Wear Distance for In Situ Tool Condition Monitoring.
IEEE Trans. Instrum. Meas., 2023
Proceedings of the 15th IEEE International Conference on ASIC, 2023
2022
IEEE Trans. Instrum. Meas., 2022
Reconstruction Domain Adaptation Transfer Network for Partial Transfer Learning of Machinery Fault Diagnostics.
IEEE Trans. Instrum. Meas., 2022
Pareto-Optimal Adaptive Loss Residual Shrinkage Network for Imbalanced Fault Diagnostics of Machines.
IEEE Trans. Ind. Informatics, 2022
Online Remaining Useful Life Prediction of Milling Cutters Based on Multisource Data and Feature Learning.
IEEE Trans. Ind. Informatics, 2022
Multiple Activation Functions and Data Augmentation-Based Lightweight Network for In Situ Tool Condition Monitoring.
IEEE Trans. Ind. Electron., 2022
Automatically Designing Network-Based Deep Transfer Learning Architectures Based on Genetic Algorithm for In-Situ Tool Condition Monitoring.
IEEE Trans. Ind. Electron., 2022
IEEE Trans. Circuits Syst. II Express Briefs, 2022
IEEE Trans. Circuits Syst. II Express Briefs, 2022
YOLO-SLAM: A semantic SLAM system towards dynamic environment with geometric constraint.
Neural Comput. Appl., 2022
2020
A Data-Flow Oriented Deep Ensemble Learning Method for Real-Time Surface Defect Inspection.
IEEE Trans. Instrum. Meas., 2020