Yubin Qu

According to our database, Yubin Qu authored at least 11 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2024

A survey on robustness attacks for deep code models.

Yubin Qu, Song Huang, Yongming Yao

Autom. Softw. Eng., November, 2024

Detection of backdoor attacks using targeted universal adversarial perturbations for deep neural networks.

Yubin Qu, Song Huang, Xiang Chen, Xingya Wang, Yongming Yao

J. Syst. Softw., January, 2024

CriticalFuzz: A critical neuron coverage-guided fuzz testing framework for deep neural networks.

Tongtong Bai, Song Huang, Yifan Huang, Xingya Wang, Chunyan Xia, Yubin Qu, Zhen Yang

Inf. Softw. Technol., 2024

2022

Empirical Research for Self-Admitted Technical Debt Detection in Blockchain Software Projects.

Yubin Qu, W. Eric Wong, Dongcheng Li

Int. J. Perform. Eng., 2022

Do we need to pay technical debt in blockchain software systems?

Yubin Qu, Tie Bao, Xiang Chen, Long Li, Xianzhen Dou, Meng Yuan, Hongmei Wang

Connect. Sci., 2022

Can We Predict Student Performance Based on Tabular and Textual Data?

Yubin Qu, Fang Li, Long Li, Xianzhen Dou, Hongmei Wang

IEEE Access, 2022

CIL-BSP: Bug Report Severity Prediction based on Class Imbalanced Learning.

Yu Su, Xinping Hu, Xiang Chen, Yubin Qu, Qianshuang Meng

Proceedings of the 22nd IEEE International Conference on Software Quality, 2022

2020

Do different cross-project defect prediction methods identify the same defective modules?

Xiang Chen, Yanzhou Mu, Yubin Qu, Chao Ni, Meng Liu, Tong He, Shangqing Liu

J. Softw. Evol. Process., 2020

LAL: Meta-Active Learning-based Software Defect Prediction.

Yubin Qu, Fang Li, Xiang Chen

Int. J. Perform. Eng., 2020

Active Learning Empirical Research on Cross-Version Software Defect Prediction Datasets.

Fang Li, Yubin Qu, Junxia Ji, Dejun Zhang, Long Li

Int. J. Perform. Eng., 2020

Empirical Evaluation on the Impact of Class Overlap for EEG-Based Early Epileptic Seizure Detection.

Yubin Qu, Xiang Chen, Fang Li, Fan Yang, Junxia Ji, Long Li

IEEE Access, 2020