Yuanzhong Paul Zhou

According to our database, Yuanzhong Paul Zhou authored at least 12 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2024

Reduced RC Time Constant High Voltage Tolerant Supply Clamp for ESD Protection in 16nm FinFET Technology.

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology.

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology.

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2019

Characterization and Modeling of the Transient Safe Operating Area in LDMOS Transistors.

Hang Li, Kalpathy B. Sundaram, Yuanzhong Paul Zhou, Javier A. Salcedo, Jean-Jacques Hajjar

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2017

ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications.

Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou

Microelectron. Reliab., 2017

2015

Design and characterization of ESD solutions with EMC robustness for automotive applications.

Yunfeng Xi, Javier A. Salcedo, Yuanzhong Paul Zhou, Juin J. Liou, Jean-Jacques Hajjar

Microelectron. Reliab., 2015

Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation.

Meng Miao, Yuanzhong Paul Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou

Microelectron. Reliab., 2015

2014

Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications.

Qiang Cui, Srivatsan Parthasarathy, Javier A. Salcedo, Juin J. Liou, Jean-Jacques Hajjar, Yuanzhong Paul Zhou

Microelectron. Reliab., 2014

2013

vfTLP-V_TH: A new method for quantifying the effectiveness of ESD protection for the CDM classification test.

Yuanzhong Paul Zhou, David Ellis, Jean-Jacques Hajjar, Andrew Olney, Juin J. Liou

Microelectron. Reliab., 2013

Investigation on effectiveness of series gate resistor in CDM ESD protection designs.

Yuanzhong Paul Zhou, Alan W. Righter, Jean-Jacques Hajjar

Proceedings of the IEEE 10th International Conference on ASIC, 2013

2012

Modeling of high voltage devices for ESD event simulation in SPICE.

Yuanzhong Paul Zhou, Javier A. Salcedo, Jean-Jacques Hajjar

Microelectron. J., 2012

2005

Modeling MOS Snapback for Circuit-Level ESD Simulation Using BSIM3 and VBIC Models.

Yuanzhong Paul Zhou, Duane Connerney, Ronald Carroll, Timwah Luk

Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005