Yuanrui Fan

Orcid: 0000-0001-5234-0152

According to our database1, Yuanrui Fan authored at least 10 papers between 2018 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2022
Just-In-Time Defect Identification and Localization: A Two-Phase Framework.
IEEE Trans. Software Eng., 2022

The Impact of Duplicate Changes on Just-in-Time Defect Prediction.
IEEE Trans. Reliab., 2022

2021
The Impact of Mislabeled Changes by SZZ on Just-in-Time Defect Prediction.
IEEE Trans. Software Eng., 2021

What makes a popular academic AI repository?
Empir. Softw. Eng., 2021

A Differential Testing Approach for Evaluating Abstract Syntax Tree Mapping Algorithms.
Proceedings of the 43rd IEEE/ACM International Conference on Software Engineering, 2021

2020
Chaff from the Wheat: Characterizing and Determining Valid Bug Reports.
IEEE Trans. Software Eng., 2020

Effort-aware just-in-time defect identification in practice: a case study at Alibaba.
Proceedings of the ESEC/FSE '20: 28th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 2020

JITO: a tool for just-in-time defect identification and localization.
Proceedings of the ESEC/FSE '20: 28th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 2020

Deep Learning Based Valid Bug Reports Determination and Explanation.
Proceedings of the 31st IEEE International Symposium on Software Reliability Engineering, 2020

2018
Early prediction of merged code changes to prioritize reviewing tasks.
Empir. Softw. Eng., 2018


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