Yu. Lebedinskii

Orcid: 0000-0002-9324-2716

According to our database1, Yu. Lebedinskii authored at least 2 papers in 2007.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2007
Degradation kinetics of ultrathin HfO<sub>2</sub> layers on Si(1 0 0) during vacuum annealing monitored with in situ XPS/LEIS and ex situ AFM.
Microelectron. Reliab., 2007

Effective work function of NiSi/HfO<sub>2</sub> gate stacks measured with X-ray photoelectron spectroscopy.
Microelectron. Reliab., 2007


  Loading...