Yu. Lebedinskii
Orcid: 0000-0002-9324-2716
According to our database1,
Yu. Lebedinskii
authored at least 2 papers
in 2007.
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Bibliography
2007
Degradation kinetics of ultrathin HfO<sub>2</sub> layers on Si(1 0 0) during vacuum annealing monitored with in situ XPS/LEIS and ex situ AFM.
Microelectron. Reliab., 2007
Effective work function of NiSi/HfO<sub>2</sub> gate stacks measured with X-ray photoelectron spectroscopy.
Microelectron. Reliab., 2007